Comprehensive Element Library
Resistors, inductors and capacitors (ideal/lossy, self-resonant), reactances, complex
impedances, dependent sources, ideal transformer, multiport blackbox devices (S, Y,
Z-parameters), port terminations (impedance, gamma or black box), transmission lines,
coupled lines, attenuator, transformer, control blocks (summing, integrator,
differentiator, pole, zero, gain), bipolar, FET and diode semiconductor models, microstrip
and stripline structures.
Element Assistant
(screen shot)Eclipse's
unparalleled Element Assistant makes memorizing element parameters completely unnecessary.
Press F2 on an element in the netlist and the Assistant pops up with data fields clearly
labeled for all element parameters. Each field displays context sensitive help with full
on-line documentation a mouse click away.
User-defined variables
provide powerful input and output processing capabilities. This powerful feature lets
you combine constants, Program Variables (such as Y, Z or S-parameters, gain, current
frequency, etc.), Program Functions and other User Variables into interrelated complex
mathematical expressions. Once defined, your "programmable" User Variables can
be graphed or used as element parameter inputs.
Flexible Sweep Capability(screen shot) You have complete control over
circuit stimulus and output processing through Eclipse's project notebook. Each page
contains its own definition regarding how the circuit is to be swept. Eclipse can sweep a
circuit by changing the frequency, an element parameter or User Variable. Element sweeping
allows you to directly vary any single parameter of any element over a chosen range of
values at a single frequency. Variable sweeping allows you to similarly vary a User
Variable; however, since User Variables can be assigned to element parameters, elements
can be indirectly varied as well. The possibilities are limitless.
Design Versioning Each Eclipse project can store up to 10 versions of a design. This allows
you to keep the history of progression from one conceptual design to another in a single
file! Each version contains all project parameters, including netlist, variables,
optimization goals, graph sheets, etc.
Manual Element Tuning
(screen shot)Rapidly tune multiple elements and/or User Variables
using 1%, 5% or 10% increments or standard EIA increments (1%, 5% and 10%). Independent
save/recall registers are available for intermediate storage of tuning values.
Optimization (Professional
version only) (screen shot) Use
Eclipse's powerful optimization features to automatically minimize the difference between
desired and actual circuit performance. Performance goals are formulated in terms of
mathematical expressions comprised of Program and/or User Variables. You can mix relative
as well as absolute specifications when defining goals. Eclipse's summary box will show
you the contribution of each goal to the overall error.
Monte Carlo/Yield
Analysis (Professional version only) Predict manufacturing repeatability using Monte Carlo/Yield
analysis. While an ideal circuit with precise design values might appear to provide
acceptable performance, the cumulative effect of component tolerances may make the design
unusable due to excessive failures during manufacturing. Eclipse helps you to determine
the repeatability of your design by providing several graphical/tabular views of the
sampling results. Using the results of the analysis, you can tighten or relax component
tolerances and/or performance specifications in a more informative way.
Output Parameters
S, Y, Z-parameters (1 to 4 ports), Maximum Available Gain, group delay, voltage gain
(three types), Series or Parallel impedances (reactance displayed as ohms, inductance or
capacitance), Stability Criteria (K, Rs_min/ Rp_max for guaranteed stability), Gain
Circles. Output can viewed in graphical or tabular form.
Network Analyzer-style Markers
Eclipse provides four independent markers for each graph. Each marker's X
and Y values are automatically tracked and displayed during simulation, tuning and
optimization. Various marker functions are available to enhance displayed information.
Custom Graphs (screen shot, Yield Graph, Smith Chart) Just right mouse click on any graph to independently
customize its appearance using the Graph Properties dialog box. For instance, with the
Autolines feature you can define additional boundary lines to be drawn on each graph. Save
traces to memory for comparison with "live" data or enable Eclipse's history
feature to dynamically retain and display up to 5 of the most recent traces.
Industry Standard Data
Files Data files may be imported/exported in industry
standard format.
